In this area we work closely with the German company Neaspec. Using NEAspec SNOM microscopes with a spatial resolution of up to 10 nanometers, it is possible to perform very fast mapping measurements from the visible to the terahertz region of the electromagnetic spectrum, including direct acquisition of FT-IR spectra from a sample area of approx. 10 nanometers!

This method is suitable e.g. for refractive index studies, chemical structure determination, mechanical deformation monitoring, surface mapping (AFM) and charge distribution or hot spot characterization (SERS). For greater variability of experiments, a cryo-neaSNOM system for measurements under cryogenic conditions or a broadband laser capable of excitation in the range of 5 - 15 micrometers is also available.

Main analytical applications of IR near-field microscopy:

• Biomaterials (proteins, viruses)
• Graphene (visualization of Dirac plasmon, mapping of nanolayer surfaces)
• Nanostructures (ultra-fast nanofiber spectroscopy)
• Plasmonic structures (analysis of nano-antennas, surface phonons)
• Polymers (mapping of polymer mixtures, surface topography + identification of polymers)
• Semiconductors (Terahertz microscopy of SiO/Si structures, organic semiconductors, local conductivity mapping)

• Analysis of secondary structure of protein complexes
• Study of structural changes in viral envelopes
• Graphene plasmons
• Graphene plasmons with resonating antennas and conductivity measurements
• Ultrafast spectroscopy of electric nanomovements in nanowires
• Analysis of optical nano antennas
• Characterization of optical surface waves
• Nano-FTIR spectroscopy of the "fingerprint" region with 20nm spatial resolution
• Near field terahertz microscopy with better than 30 nm spatial resolution
• Nano-imaging: disorder of molecules in organic semiconductors