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cryo-neaSCOPE+xs is a pioneering instrument for nanoscale optical imaging and spectroscopy in an extreme cryogenic environment.

Takes your research to the next level:

  • Nanoscale optical analysis at cryogenic temperatures down to 10 K
  • Using best-in-class s-SNOM and nano-FTIR technologies, it brings a variety of applications to your research from infrared to THz thanks to compatible Neaspec lighting and detection modules
  • Fast turnaround time and low-cost operation thanks to a fully automated high-vacuum closed-loop cryostat
  • Great spectrometer e.g. for: for research of graphene, inorganic materials or semiconductors

Using cryo-neaSCOPE+xs it is possible to study e.g. properties of plasmon on graphene

cryo-neaSCOPE+xs enables near-field optical nano-imaging and nano-spectroscopy at extreme cryogenic temperatures. With it, you can perform high-quality near-field measurements in an unrivaled spectral range from the visible to the IR part of the spectrum, and even in THz frequencies. The system thus gives you access to a number of interesting applications and allows you to study physical phenomena at extremely low temperatures. The cryo-neaSCOPE+xs is based on a fully automated, easy-to-operate cryogen-free dry cryostat with the fastest turnaround time in its class. It provides confocal access to the sample and supports electrical transport measurements via integrated feedthroughs for ultimate cryogenic research.

IR-neaSCOPE is the basic model for infrared imaging and nano-spectroscopy. It provides maximum performance without damaging the sample. This is a cost-effective solution for samples with a high coefficient of thermal expansion.
VIS-neaSCOPE+s enables the measurement of polarization-resolved maps in the near field and the analysis of the electromagnetic field of the sample: phase and amplitude.
IR-neaSCOPE+fs is designed for pump-probe spectroscopy with 10fs temporal and 10nm spatial resolution: it enables ultra-fast nanoscale science.
IR-neaSCOPE+s enables IR imaging and nano-FTIR spectroscopy by detecting radiation reflected from a standard AFM tip. It is a universal solution for all types of materials. It measures both absorbed and reflected radiation simultaneously and uses the fastest and most reliable modules for nano-imaging and nano-spectroscopy.
THz-neaSCOPE+s is a versatile platform for nano-imaging and terahertz (THz) spectroscopy.
IR-neaSCOPE+TERs is a revolution in nano-spectroscopy thanks to a combination of nano-FTIR and Raman spectroscopy techniques, providing complete spectral analysis.
SNOM (near field scanning optical microscopy or NSOM) is a microscopic technique that exceeds the resolution limit due to the properties of attenuated waves. The distance between the detector and the sample is less than the wavelength of light when measured, and this is used in optical microscopy, among other things, for its ability to increase the contrast of nanoparticles.

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