IR-neaSCOPE + TERs is a revolution in nano-spectroscopy thanks to a combination of nano-FTIR and Raman spectroscopy techniques, providing complete spectral analysis.
- The same sample spot is analyzed by both nano-FTIR and nano-Raman/PL spectroscopy
- Maximum TERS signal even with standard AFM probes
- A single user interface for all measurement modes optimized for working with multidimensional correlated data
- The system includes modules for s-SNOM, nano-FTIR, nano-PL and TERS
- Use in research of polymers, waveguides, nanotechnologies, carbon nanomaterials, graphene, inorganic substances, semiconductors, life sciences, photovoltaics and others
It combines nano-FTIR with TERS and photoluminescence (PL) measurements to ultimately characterize elastic and inelastic scattering of radiation from the same sample site at the nanoscale and allows a simple alignment procedure using additional infrared or visible scattering, which provides reliable data for all techniques used and with standard metallized AFM spikes.
IR-neaSCOPE is the basic model for infrared imaging and nano-spectroscopy. It provides maximum performance without damaging the sample. This is a cost-effective solution for samples with a high coefficient of thermal expansion.
VIS-neaSCOPE+s enables the measurement of polarization-resolved maps in the near field and the analysis of the electromagnetic field of the sample: phase and amplitude.
IR-neaSCOPE+fs is designed for pump-probe spectroscopy with 10fs temporal and 10nm spatial resolution: it enables ultra-fast nanoscale science.
IR-neaSCOPE+s enables IR imaging and nano-FTIR spectroscopy by detecting radiation reflected from a standard AFM tip. It is a universal solution for all types of materials. It measures both absorbed and reflected radiation simultaneously and uses the fastest and most reliable modules for nano-imaging and nano-spectroscopy.
THz-neaSCOPE+s is a versatile platform for nano-imaging and terahertz (THz) spectroscopy.
cryo-neaSCOPE+xs is a pioneering instrument for nanoscale optical imaging and spectroscopy in an extreme cryogenic environment.
SNOM (near field scanning optical microscopy or NSOM) is a microscopic technique that exceeds the resolution limit due to the properties of attenuated waves. The distance between the detector and the sample is less than the wavelength of light when measured, and this is used in optical microscopy, among other things, for its ability to increase the contrast of nanoparticles.