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IR-neaSCOPE+s

Product-IR-neaSCOPE-s

IR-neaSCOPE+s

IR-neaSCOPE+s enables IR imaging and nano-FTIR spectroscopy by detecting radiation reflected from a standard AFM tip. It is a universal solution for all types of materials. It measures both absorbed and reflected radiation simultaneously and uses the fastest and most reliable modules for nano-imaging and nano-spectroscopy.

It has basically unlimited configuration options: nano-FTIR, transmission, backlight, photocurrent… and combines multi-port beam path design with other patented technologies.

It is designed for complete chemical analysis and mapping with 10nm spatial resolution and uses the latest near-field microscopy technology to measure absorption and reflectivity, as well as amplitude and phase measurements.

It is also suitable for nano-imaging, spot spectroscopy and hyperspectral imaging with a continuous (CW) radiation source and for nano-FTIR spectroscopy with broadband lasers and synchrotron radiation. It is an excellent solution for both organic and inorganic materials with a wide range of possible applications.

In addition to the modules for AFM-IR, s-SNOM and nano-FTIR, it can be easily extended with a module for transmission measurements.

IR-neaSCOPE is the basic model for infrared imaging and nano-spectroscopy. It provides maximum performance without damaging the sample. This is a cost-effective solution for samples with a high coefficient of thermal expansion.
VIS-neaSCOPE+s enables the measurement of polarization-resolved maps in the near field and the analysis of the electromagnetic field of the sample: phase and amplitude.
IR-neaSCOPE+fs is designed for pump-probe spectroscopy with 10fs temporal and 10nm spatial resolution: it enables ultra-fast nanoscale science.
THz-neaSCOPE+s is a versatile platform for nano-imaging and terahertz (THz) spectroscopy.
IR-neaSCOPE+TERs is a revolution in nano-spectroscopy thanks to a combination of nano-FTIR and Raman spectroscopy techniques, providing complete spectral analysis.
cryo-neaSCOPE+xs is a pioneering instrument for nanoscale optical imaging and spectroscopy in an extreme cryogenic environment.
SNOM (near field scanning optical microscopy or NSOM) is a microscopic technique that exceeds the resolution limit due to the properties of attenuated waves. The distance between the detector and the sample is less than the wavelength of light when measured, and this is used in optical microscopy, among other things, for its ability to increase the contrast of nanoparticles.

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