IR-neaSCOPE+s enables IR imaging and nano-FTIR spectroscopy by detecting radiation reflected from a standard AFM tip. It is a universal solution for all types of materials. It measures both absorbed and reflected radiation simultaneously and uses the fastest and most reliable modules for nano-imaging and nano-spectroscopy.
It has basically unlimited configuration options: nano-FTIR, transmission, backlight, photocurrent… and combines multi-port beam path design with other patented technologies.
It is designed for complete chemical analysis and mapping with 10nm spatial resolution and uses the latest near-field microscopy technology to measure absorption and reflectivity, as well as amplitude and phase measurements.
It is also suitable for nano-imaging, spot spectroscopy and hyperspectral imaging with a continuous (CW) radiation source and for nano-FTIR spectroscopy with broadband lasers and synchrotron radiation. It is an excellent solution for both organic and inorganic materials with a wide range of possible applications.
In addition to the modules for AFM-IR, s-SNOM and nano-FTIR, it can be easily extended with a module for transmission measurements.
