Nicolet CZ offers a wide range of infrared spectrometers with Fourier transform in various configurations, including accessories. Individual types of devices differ mainly in their capabilities and applications for which they are suitable. If you have any questions or concerns, please contact us . We will be happy to help you choose a suitable spectrometer for your workplace or develop applications. You can also use the following suitable spectrometer selection guide .
Quickly identify unknown materials and contaminants that can affect the quality of your product and provide quick identification of unknown substances. The Nicolet iN5 FT-IR microscope provides quick identification with the simplicity of point-and-shoot measurements. The Nicolet iN5 offers the simplicity of an FT-IR spectrometer along with the ability to measure samples down to several micrometers in size.
The Nicolet iN10 is a revolutionary Fourier transform infrared microscope that offers the simplicity of an FT-IR spectrometer along with the ability to measure samples down to several micrometers in size. It has been developed specifically for analysts, technicians and scientists who know exactly what information they want but do not have time to become a microscopy specialist, and for experts looking for better answers in a faster way.
The Nicolet iN10 MX infrared microscope brings all the advantages of the Nicolet iN10. Up to three integrated detectors are a new option, including the patented MCT-A imaging detector. Infrared imaging brings revolutionary spectra and map measurements.
A unique, specially developed system for the analysis of silicon components. Complete automation is of course possible!
The Nicolet Antaris IGS gas analyzer sets a new standard for gas analysis thanks to its intuitive use and unique combination of performance and application support. The Nicolet Antaris IGS FT-IR spectrometer is a multicomponent gas mixture analyzer capable of simultaneously analyzing up to one hundred mixture components. It provides the highest possible system performance in the stability of calibrations, in the management of analytical methods, in their transferability to another instrument and especially in the speed of data measurement.
SNOM (near field scanning optical microscopy or NSOM) is a microscopic technique that exceeds the resolution limit due to the properties of attenuated waves. The distance between the detector and the sample is less than the wavelength of light when measured, and this is used in optical microscopy, among other things, for its ability to increase the contrast of nanoparticles.