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Non-contact and non-destructive analysis of art objects and cultural heritage

The analysis of works of art and cultural heritage objects is important for many reasons. Whether to determine the time of creation, to detect counterfeits, to study the development of historical production technologies or so that the work can be repaired correctly and with quality. Determining the chemical composition is also crucial because some pigments can be unstable in the light, and so, for example, unsuitable lighting can cause irreversible damage to the work of art.

FT-IR spectrometer with external module ConservatIR for reflectance measurement

FT-IR spectroscopy and microscopy is a reliable, traditionally used method of analysis of colors, pigments and binders of works of art. It offers various sampling techniques: the most common are transmission measurements and the attenuated total reflection (ATR) method. The former requires a thin layer of sample, so it is often necessary to remove a part from the measured object or compress it to a thickness in the range of 5 - 30 µm. The ATR technique requires very good contact between the sample and the diamond, and logically, these methods are not non-invasive.

If it is not possible or appropriate to take a sample of the test substance, it then seems ideal to use FT-IR reflectance, in which the reflected radiation is analyzed. An external ConservatIR attachment can be used for this, which not only enables contactless analysis, but also minimizes the need to place the sample on a microscope stage or in a standard sample space.

FT-IR spectra of red pigment (pyrrole red) measured by ATR and FT-IR reflectance and acrylic paint spectrum

In the last decade, thousands and thousands of users have set the Nicolet iS10 FTIR spectrometer as the new, high standard for laboratory infrared spectrometers. Now its successor, the Nicolet iS20 FTIR spectrometer, is raising the innovative bar to the next level!
The Nicolet iS50is the first scientific one-touch FT-IR spectrometer. Based on extensive experience with previous successful Magna, Nexus and Nicolet X700 scientific systems, a new FT-IR spectrometer has been developed which, thanks to a wide range of measuring accessories and interconnected analytical software, delivers a universal material analysis system with unrivaled ease of use.
The Nicolet DXR3 Dispersi Raman Microscope is an instrument designed for applications requiring high spatial resolution, ease of sample preparation, and the use of the strongpoints of Raman microscopy.
The user-proven DXR Raman microscope is now available in the new version of the DXR3xi with a high-performance EMCCD detector and a microscopic table with the possibility of nanoslift for super fast Chemical Imaging of your samples.

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