Carbon nanoapplications
- Application description
- Raman spectroscopy
- FT-IR spectroscopy
- Other
Carbon is the fourth most abundant element on Earth. It is the basis of all life and also plays a crucieal role in many technologies. In addition to the notorious diamond and graphite, we can also encounter graphene, single or multilayer nanotubes or fullerenes, the application of which is intensively studied in many fields of nanotechnology.
Various carbon nanostructures of carbon (allotropes) are the subject of research of nanosensors, biotechnologies, where they can work e.g. such as organ-growing matrices, drug carriers or gene transfer vectors, solar cells, water purification membranes, hydrogen storage and many other areas.
The Nicolet DXR3 Dispersi Raman Microscope is an instrument designed for applications requiring high spatial resolution, ease of sample preparation, and the use of the strongpoints of Raman microscopy.
The user-proven DXR Raman microscope is now available in the new version of the DXR3xi with a high-performance EMCCD detector and a microscopic table with the possibility of nanoslift for super fast Chemical Imaging of your samples.
The Nicolet iS50is the first scientific one-touch FT-IR spectrometer. Based on extensive experience with previous successful Magna, Nexus and Nicolet X700 scientific systems, a new FT-IR spectrometer has been developed which, thanks to a wide range of measuring accessories and interconnected analytical software, delivers a universal material analysis system with unrivaled ease of use.
SNOM (near field scanning optical microscopy or NSOM) is a microscopic technique that exceeds the resolution limit due to the properties of attenuated waves. The distance between the detector and the sample is less than the wavelength of light when measured, and this is used in optical microscopy, among other things, for its ability to increase the contrast of nanoparticles.
- Analysis of graphene and graphene composites
- Analysis of surface modifications of gold-coated nanostructures for SERS
- Portable BWTek analyzer for carbon nanostructures
- Determination of graphene layer thickness using Raman spectroscopy
- Study of deposition of graphene layers by carbon vapor using chemical imaging (Raman spectroscopy)
- Characterization of amorphous and microcrystalline silicon by Raman spectroscopy
- Measurement of diamond-like carbon films using dispersive Raman spectroscopy
- Chemical mapping of single-walled carbon nanotubes on phase-separated polystyrene and polymethyl methacrylate
- Evaluation of purification methods for single-walled nanostructures using Raman spectroscopy
- At-line characterization of carbon nanostructures