The diffraction limit is a constraint that determines how small objects you can study with a given wavelength: the spatial resolution is directly proportional to the wavelength used, and you can use green light at 500 nm to distinguish two points that can be closest to 250 nm. There are a number of techniques with which you can overcome this, but SNOMtechnology goes much further: thanks to its unique principle, you can measure nano-objects with a spatial resolution of up to 10 nm. It uses the wave properties in the so-called near field, and its spatial resolution thus depends only on the size of the tip, which moves above the sample.
If you would like to learn more about this exceptional technology, we would like to invite you to a webinarto be held on July 7, 2021. You will learn the basic principle of SNOM, you will see a number of interesting practical examples in which SNOM can be used, and you will learn how to use this method to measure the mechanical, electrical and thermal properties of samples.